HITACHI S-2500 SCANNING ELECTRN MICROSCOPE

FEATURES

OPERATING INSTRUCTIONS

To turn on microscope

To leave microscope

To turn off microscope

To exchange specimen

To observe image

Working distance
Stage
Secondary electron detector

0 to -3

Upper
Upper

0 to +10

Lower
Upper

> +10

Lower
Lower
Control
Secondary electron image
Backscattered electron image
Energy dispersive X-ray analysis
COND 2

Acc Voltage >5 kV

5-8, 6 usual
4-6, 5 usual
4-6, 5 usual

Acc Voltage <5 kV

4-7, 5 usual
3-5, 4 usual
3-5, 4 usual
COND 1
According to image
According to image
According to image

To correct astigmatism

To change objective aperture

Secondary electron image
Backscattered electron image
Energy dispersive X-ray analysis
Objective aperture
3 or 4
2 or 3
2 or 3

 

To operate raster rotation unit

To activate keyboard

To display data

Arrow Moves cursor in direction of arrow
CR/LF Line feed
SP Inssserts space
CLF ALL Erases all characters on screen
CLF LIN Erases characters on line indicated by curssor

To photograph image

Split screen mode

Ultrahigh resolution position

Robinson backscattered detector

GW transmitted electron detector