Syllabus
(tentative)
Ethics
in Engineering
INTRODUCTION TO MATERIALS CHARACTERIZATION (Added 8/29/07)
CRYSTALLOGRAPHY (Added
9/04/07)
RECIPROCAL LATTICES AND DIFFRACTION (Added 9/13/07)
X-ray Diffraction
Production & Properties of X-rays (coming soon)
Interaction of X-rays With Matter (coming soon)
The
Structure Factor (coming soon)
Intensity of the Diffracted Beam (coming soon)
Geometry of the Diffractometer (coming soon)
OPTICAL
MICROSCOPY (Added 9/07/2007)
Electron Microscopy
Overview
Transmission Electron
Microscopy (TEM)
Scanning Electron
Microscopy (SEM)
Electron Probe
Microanalysis, i.e., electron microprobe (EPMA)
Chemical Analysis in the
SEM (EDS, WDS)
Chemical Analysis in the
TEM (EDS, EELS)
Surface Analysis: XPS,
AES
Scanning Probe
Microscopy (AFM, STM, etc.)
Surface Analysis: SIMS,
RBS
Practical Applications
of Experimental Methods (Lectures, Labs, and Demonstrations)
-
Basic metallography
and optical microscopy (in class)
-
Crystal structure
determination via XRD for cubic crystals
-
Crystal structure
determination via XRD for non-cubic crystals
-
Lattice parameter
determination via XRD and application for phase diagram determination
-
Determination of
long-range ordering via XRD
-
Crystal size and
lattice strain via XRD
-
Quantitative analysis
of mixtures via XRD and electron microscopy
-
Surface analysis of
materials via XPS
-
Complete
identification of unknowns via XRD and electron microscopy
TIPS
FOR TECHNICAL WRITING (Added 9/09/2007)
